ams OSRAM authors report shared functional coverage across DMS and AMS verification of analog IP
A DVCon Europe 2025 paper by ams OSRAM authors describes collecting analog-IP functional coverage from the same UVM top-level testbench for real-number models and transistor-level schematics. A common real-valued reference and mixed-signal sampler supported both modes; the authors report that AMS runs exposed effects such as glitch filtering that the real-number model did not reproduce.
Evidence
Implementing Functional Coverage for Analog IPs in Mixed-Signal Verification Environments ↗
DVCon's record identifies the ams OSRAM functional-coverage paper.
Implementing Functional Coverage for Analog IPs in Mixed-Signal Verification Environments — paper ↗
The paper documents the shared UVM coverage approach across DMS and AMS modes and the analog effects observed only in schematic runs.