ams OSRAM

Last researched 2026-10-054 indexed events

Public events shown here describe observable source material, not total internal activity.

20262025

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Sep 3, 2026

ams OSRAM LSP role combines RNM model validation, UVM integration and AMS top-level checks

ams OSRAM posted a Bucharest ASIC Analog Mixed-Signal Verification Engineer role in its Light Sensors & Photonics business unit. The position defines verification strategies and plans, develops and validates analog and real-number behavioral models, integrates analog models into UVM mixed-signal testbenches, and executes top-level AMS verification with automatic checks. The qualifications name SystemVerilog RNM, Verilog-AMS, analog checkers, reusable verification components and scripting.

Mar 20, 2026

ams OSRAM seeks a leader for distributed AMS/DMS verification methodology and model libraries

ams OSRAM posted a Senior Principal Mixed-Signal Verification Engineer role to lead a distributed verification team and own an AMS/DMS methodology roadmap. The mandate covers reusable EEnet/UDN model libraries, DMS-to-Spectre correlation, SystemVerilog/UVM-MS environments, assertions, coverage, regression, sign-off criteria, and Python automation. This is evidence of a public hiring mandate, not proof that every listed method was already deployed across the organization.

Oct 15, 2025

ams OSRAM authors report a DMS flow for early full-chip power estimation

An ams OSRAM DVCon Europe 2025 paper reports using digital mixed-signal simulation for early full-chip power estimation. Analog-model states map to quiescent-current values inside a central UVM testbench spanning multiple rails and IP blocks. The authors present the method as an early-estimation aid alongside detailed verification, not as a replacement for analog sign-off.

2025

ams OSRAM authors report shared functional coverage across DMS and AMS verification of analog IP

A DVCon Europe 2025 paper by ams OSRAM authors describes collecting analog-IP functional coverage from the same UVM top-level testbench for real-number models and transistor-level schematics. A common real-valued reference and mixed-signal sampler supported both modes; the authors report that AMS runs exposed effects such as glitch filtering that the real-number model did not reproduce.