Infineon case study runs the same test program on virtual and physical ATE before first silicon

A JKU/Infineon paper presented a virtual ATE flow that executes production-style test programs against a SystemC/SystemC-AMS virtual DUT before first silicon. In an Infineon ASIC case study, the same test program was run on the virtual ATE and later on a Teradyne UltraFLEX system, exposing the same register-test error; the authors report that this enabled test-program checks months earlier than the conventional flow.