Samsung authors report reusing a UVM environment with SPICE for display-PMIC AMS verification
A DVCon Europe 2024 paper by Samsung authors describes reusing a configurable digital mixed-signal UVM environment for a selected set of analog/mixed-signal tests coupled to a SPICE simulator. In the display-PMIC case, the authors report finding critical schematic issues before tapeout and correlating verification results with silicon measurements.
Evidence
A Configurable Re-Usable UVM Environment Coupled with an Advanced SPICE Simulator for AMS Verification of a Display PMIC ↗
DVCon's record identifies the Samsung display-PMIC UVM and SPICE verification paper.
A Configurable Re-Usable UVM Environment Coupled with an Advanced SPICE Simulator — paper ↗
The paper describes UVM-environment reuse for AMS/SPICE tests, reported pre-tapeout schematic findings, and silicon correlation.