Siemens author demonstrates capacitance-aware resolved nets and SV-RNM model debugging
A DVCon U.S. 2022 paper by Siemens EDA's Mariam Maurice describes a SystemVerilog resolved-net model carrying voltage, previous voltage, current, capacitance, and resistance. It illustrates loading and filtering effects, real/logic boundary conversion, and interconnect debugging, with ADC, DAC, LDO, and image-sensor examples. The paper identifies UVM, assertions, and functional coverage as future verification work.
Evidence
DVCon archive record for Mariam Maurice's SV-RNM paper ↗
Official proceedings index identifies the author, U.S. conference, 2022 year, and paper publication type.
Modeling Analog Devices using SV-RNM ↗
Paper identifies the Siemens affiliation and documents the capacitance-aware resolution function, boundary/interconnect inspection, device examples, and future verification work.