Marcel Oosterhuis

2 indexed events

Public technical and organizational events indexed by this site.

20242020–2018

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2024

NXP authors report reusing AMS verification tests in post-silicon validation

An NXP-authored paper reports reusing pre-silicon AMS functional tests in post-silicon validation with matching stimulus timing and side-by-side waveform visualization. The methodology uses Jupyter and Python around a reusable environment for product variants; the authors report deployment across multiple projects and products and one-day silicon bring-up.

2018

NXP authors extend one UVM environment across the digital and analog sides of an automotive Ethernet PHY

An NXP-authored paper reports verifying an IEEE 802.3bw 100BASE-T1 PHY with one UVM environment extended to handle its analog interface. The environment adds analog source and probe components, error injection, and analog-domain coverage while retaining the digital UVM register-model environment; the authors demonstrate the approach on a released automotive Ethernet PHY.